[J-1-3] Experimental verification of a CMOS imager with block-parallel scanning for focal-plane pinhole effect in multi-beam confocal microscopy

M. W. Seo¹、K. Kagawa¹、K. Yasutomi¹、S. Kawahito¹ (1.Shizuoka Univ. , Japan)

https://doi.org/10.7567/SSDM.2012.J-1-3