Limiting Factor Analysis of Device Operation of Organic Thin Film Transistors by Field-Induced Electron Spin Resonance

H. Matsui; D. Kumaki; E. Takahashi; M. Ikawa; I. Osaka; T. Abe; K. Takimiya; S. Tokito; T. Hasegawa

doi:https://doi.org/10.7567/SSDM.2012.M-2-5

[M-2-5] Limiting Factor Analysis of Device Operation of Organic Thin Film Transistors by Field-Induced Electron Spin Resonance

H. Matsui¹, D. Kumaki², E. Takahashi^1,3, M. Ikawa¹, I. Osaka⁴, T. Abe⁴, K. Takimiya⁴, S. Tokito², T. Hasegawa¹ (1.FLEC, AIST, 2.ROEL, Yamagata Univ., 3.SCAS, 4.Hiroshima Univ. , Japan)

https://doi.org/10.7567/SSDM.2012.M-2-5

2012 International Conference on Solid State Devices and Materials

[M-2-5] Limiting Factor Analysis of Device Operation of Organic Thin Film Transistors by Field-Induced Electron Spin Resonance