Limiting Factor Analysis of Device Operation of Organic Thin Film Transistors by Field-Induced Electron Spin Resonance

H. Matsui; D. Kumaki; E. Takahashi; M. Ikawa; I. Osaka; T. Abe; K. Takimiya; S. Tokito; T. Hasegawa

doi:https://doi.org/10.7567/SSDM.2012.M-2-5

[M-2-5] Limiting Factor Analysis of Device Operation of Organic Thin Film Transistors by Field-Induced Electron Spin Resonance

H. Matsui¹、D. Kumaki²、E. Takahashi^1,3、M. Ikawa¹、I. Osaka⁴、T. Abe⁴、K. Takimiya⁴、S. Tokito²、T. Hasegawa¹ (1.FLEC, AIST、2.ROEL, Yamagata Univ.、3.SCAS、4.Hiroshima Univ. , Japan)

https://doi.org/10.7567/SSDM.2012.M-2-5

2012 International Conference on Solid State Devices and Materials

[M-2-5] Limiting Factor Analysis of Device Operation of Organic Thin Film Transistors by Field-Induced Electron Spin Resonance