[PS-6-17] Electric- Field-Driven Degradation in Off-State Step-Stressed HfO2/AlGaN/GaN Metal-Oxide-Semiconductor HFETs

J. Park¹、J. H. Shin¹、H. J. Kim²、K. C. Kim¹、T. Jang¹ (1.LG Electronics Corp.、2.Hanyang Univ. , Korea)

https://doi.org/10.7567/SSDM.2012.PS-6-17