The Japan Society of Applied Physics

[PS-6-19] Low Frequency Noise Analysis of ZnO TFTs under the Positive Gate Bias Stress

K. S. Jeong1, Y. M. Kim1, H. J. Yun1, S. D. Yang1, S. Y. Lee1, Y. S. Kim2, H. D. Lee1, G. W. Lee1 (1.Univ. of Chung-nam National, 2.National Nanofab Center , Korea)