[J-3-4] Suppression of Threshold Voltage Variation Due to Conduction Band Lowering Effect in Crystalline In-Ga-Zn-Oxide Thin Film Transistors
D. Matsubayashi1, Y. Kobayashi1, S. Matsuda1, T. Obonai2, N. Ishihara1, S. Yamazaki1
(1.Semiconductor Energy Laboratory Co., Ltd., 2.Advanced Film Device Inc. (Japan))
https://doi.org/10.7567/SSDM.2013.J-3-4