[PS-1-9] Effects of the Interface-related and Bulk-fixed Charges in Ge/GeO₂ Stack on Band Bending of Ge Studied by X-ray Photoemission Spectroscopy

W.F. Zhang^1,2, C.H. Lee^1,2, C.M. Lu¹, T. Nishimura^1,2, K. Nagashio^1,2, K. Kita^1,2, A. Toriumi^1,2 (1.Univ. of Tokyo, 2.JST-CREST (Japan))

https://doi.org/10.7567/SSDM.2013.PS-1-9