The Japan Society of Applied Physics

[PS-12-2] Correlation between the intensities of differential conductance curves and the spin accumulation signals in Si for CoFe/MgO/SOI devices

M. Ishikawa1, H. Sugiyama1, T. Inokuchi1, T. Tanamoto1, K. Hamaya2, N. Tezuka3, Y. Saito1 (1.Corporate Research & Development Center, Toshiba Corp., 2.Kyushu Univ., 3.Tohoku Univ. (Japan))

https://doi.org/10.7567/SSDM.2013.PS-12-2