[PS-3-10] High Temperature Behavior of MR-DCIV Spectroscopy and Relationship with STI-based LDMOSFETs Reliability

Y.D. He¹, G.G. Zhang¹, Y. Yang¹, X. Zhang¹ (1.Peking Univ. (China))

https://doi.org/10.7567/SSDM.2013.PS-3-10