[PS-3-8] Impact of Extension Induced Fluctuation in FinFETs with Gate Underlap Structure

Y.J. Wang¹、P. Huang¹、Z. Xin¹、X.Y. Liu¹、G. Du¹、Y. Yang¹、J.F. Kang¹ (1.Peking Univ. (China))

https://doi.org/10.7567/SSDM.2013.PS-3-8