[PS-3-8] Impact of Extension Induced Fluctuation in FinFETs with Gate Underlap Structure

Y.J. Wang¹, P. Huang¹, Z. Xin¹, X.Y. Liu¹, G. Du¹, Y. Yang¹, J.F. Kang¹ (1.Peking Univ. (China))

https://doi.org/10.7567/SSDM.2013.PS-3-8