The Influence of Water on Memory Characteristics of NiO-ReRAM

R. Ogata; K. Kinoshita; M. Yoshihara; N. Murayama; S. Kishida

doi:https://doi.org/10.7567/SSDM.2013.PS-9-14

2013 International Conference on Solid State Devices and Materials

Sep 24, 2013 - Sep 27, 2013
Hilton Fukuoka Sea Hawk, Fukuoka, Japan

[PS-9-14] The Influence of Water on Memory Characteristics of NiO-ReRAM

R. Ogata¹, K. Kinoshita^1,2, M. Yoshihara¹, N. Murayama¹, S. Kishida^1,2 (1.Tottori Univ., 2.Tottori Univ. Electronic Display Research Center (Japan))

https://doi.org/10.7567/SSDM.2013.PS-9-14

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