[A-2-1] Growth and Shrinkage of Conductive Filament in Cu/MoO_x ReRAMs Observed by Means of In-Situ TEM

M. Arita¹、Y. Ohno¹、M. Kudo¹、Y. Takahashi¹ (1.Hokkaido Univ. (Japan))

https://doi.org/10.7567/SSDM.2014.A-2-1