Study of Constant Voltage Off-state Stress on Au-free AlGaN/GaN Schottky Barrier Diodes

J. Hu; S. Stoffels; S. Lenci; T. Wu; N. Ronchi; S. You; B. Bakeroot; G. Groeseneken; S. Decoutere

doi:https://doi.org/10.7567/SSDM.2014.E-3-6

2014 International Conference on Solid State Devices and Materials

2014年9月8日〜 2014年9月11日
Tsukuba International Congress Center (EPOCHAL TSUKUBA), Ibaraki, Japan

[E-3-6] Study of Constant Voltage Off-state Stress on Au-free AlGaN/GaN Schottky Barrier Diodes

J. Hu^1,2、S. Stoffels¹、S. Lenci¹、T. Wu^1,2、N. Ronchi¹、S. You¹、B. Bakeroot^1,3、G. Groeseneken^1,2、S. Decoutere¹ (1.imec、2.KU Leuven、3.Ghent Univ. (Belgium))

https://doi.org/10.7567/SSDM.2014.E-3-6

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