[F-2-3] Validity of Direct-gap Photoluminescence Analysis for Non-destructive Characterization of Oxide/Germanium Interface

S. Kabuyanagi^1,2, T. Nishimura^1,2, T. Yajima^1,2, K. Nagashio^1,2, A. Toriumi^1,2 (1.Univ. of Tokyo, 2.JST-CREST (Japan))

https://doi.org/10.7567/SSDM.2014.F-2-3