[G-6-2] Properties of deep-level defect in Cu(In, Ga)Se₂ thin films

X.B. Hu¹、T. Sakurai¹、A. Yamada²、S. Ishizuka²、S. Niki²、K. Akimoto¹ (1.Univ. of Tsukuba、2.AIST (Japan))

https://doi.org/10.7567/SSDM.2014.G-6-2