[G-6-2] Properties of deep-level defect in Cu(In, Ga)Se₂ thin films

X.B. Hu¹, T. Sakurai¹, A. Yamada², S. Ishizuka², S. Niki², K. Akimoto¹ (1.Univ. of Tsukuba, 2.AIST (Japan))

https://doi.org/10.7567/SSDM.2014.G-6-2