[H-7-1] Thermal-Noise Suppression in Nanometer-Scale Si Field-Effect Transistors by Feedback Control with Single-Electron Resolution

K. Chida¹, K. Nishiguchi¹, G. Yamahata¹, A. Fujiwara¹ (1.NTT BRL (Japan))

https://doi.org/10.7567/SSDM.2014.H-7-1