[H-7-1] Thermal-Noise Suppression in Nanometer-Scale Si Field-Effect Transistors by Feedback Control with Single-Electron Resolution

K. Chida¹、K. Nishiguchi¹、G. Yamahata¹、A. Fujiwara¹ (1.NTT BRL (Japan))

https://doi.org/10.7567/SSDM.2014.H-7-1