[J-2-2] Improvement of S-factor Method for Evaluation of MOS Interface State Density

W.–L. Cai^1,2、M. Takenaka^1,2、S. Takagi^1,2 (1.Univ. of Tokyo、2.JST-CREST (Japan))

https://doi.org/10.7567/SSDM.2014.J-2-2