[J-2-4] Radiation Hardness Evaluations of 65 nm FD-SOI and Bulk processes by Measuring SET Pulse Widths and SEU Rates

E. Sonezaki¹, J. Furuta¹, K. Kobayashi¹ (1.Kyoto Inst. of Tech. (Japan))

https://doi.org/10.7567/SSDM.2014.J-2-4