[J-3-3] Comparison and Statistical Analysis of Four Write Stability Metrics in Bulk CMOS SRAM Cells

H. Qiu¹、T. Mizutani¹、T. Saraya¹、T. Hiramoto¹ (1.Univ. of Tokyo (Japan))

https://doi.org/10.7567/SSDM.2014.J-3-3