[K-8-3] Estimating the Density of Trap States in the Middle of the Bandgap using Ambipolar Organic Field-Effect Transistors
R. Haeusermann1, S. Chauvin1, A. Facchetti2, Z. Chen2, B. Batlogg1
(1.ETH Zurich, 2.Polyera Corp. (Switzerland))
https://doi.org/10.7567/SSDM.2014.K-8-3