[K-8-3] Estimating the Density of Trap States in the Middle of the Bandgap using Ambipolar Organic Field-Effect Transistors

R. Haeusermann¹, S. Chauvin¹, A. Facchetti², Z. Chen², B. Batlogg¹ (1.ETH Zurich, 2.Polyera Corp. (Switzerland))

https://doi.org/10.7567/SSDM.2014.K-8-3