[M-3-3] Evaluation of Uniqueness of Output from Current Mismatch ID Generation Circuit for Sensor Network Services

K. Matsunaga¹, S. Oshima¹, T. Minotani¹, T. Kondo¹, H. Morimura¹ (1.NTT Microsystem Integration Laboratories (Japan))

https://doi.org/10.7567/SSDM.2014.M-3-3