[N-2-2] Current filamentation caused by dynamic avalanche during turn-off transient under short-circuit operation of IGBTs

T. Kobayashi¹、T. Suwa¹、T. Matsudai²、T. Ogura² (1.Toshiba I.S. Corp.、2.Toshiba Corp. (Japan))

https://doi.org/10.7567/SSDM.2014.N-2-2