[N-8-4] Microwave reflectivity from 4H-SiC in the high injection condition: Impacts of the electron-hole scattering

M. Kato¹, Y. Mori¹, M. Ichimura¹ (1.Nagoya Inst. of Tech. (Japan))

https://doi.org/10.7567/SSDM.2014.N-8-4