[PS-12-11] LLG Micromagnetic Simulation on STT Efficiency of sub 30nm Perpendicular MTJs with etching damage

K. Ito¹、S. Ohuchida¹、T. Endoh¹ (1.Tohoku Univ. (Japan))

https://doi.org/10.7567/SSDM.2014.PS-12-11