[PS-4-11] Reliability Modeling of Magnetic Tunnel Junction using MgO Barrier

J.M. Lee¹、C.M. Choi¹、Y.T. Oh¹、H. Sukegawa²、S. Mitani²、Y.H. Song¹ (1.Hanyang Univ.、2.National Inst. for Materials Sci. (Korea))

https://doi.org/10.7567/SSDM.2014.PS-4-11