[PS-4-11] Reliability Modeling of Magnetic Tunnel Junction using MgO Barrier

J.M. Lee¹, C.M. Choi¹, Y.T. Oh¹, H. Sukegawa², S. Mitani², Y.H. Song¹ (1.Hanyang Univ., 2.National Inst. for Materials Sci. (Korea))

https://doi.org/10.7567/SSDM.2014.PS-4-11