Scanning Tunneling Microscopy Study of the Bipolar Resistance Switching Characteristics of Nanoscopic Conductive Filament for HfO<sub>2</sub>-based MIM stack

2014 International Conference on Solid State Devices and Materials

Sep 8, 2014 - Sep 11, 2014
Tsukuba International Congress Center (EPOCHAL TSUKUBA), Ibaraki, Japan

K.S. Yew¹, Y. Zhou¹, D.S. Ang¹ (1.Nanyang Tech. Univ. (Singapore))