[PS-4-4] Scanning Tunneling Microscopy Study of the Bipolar Resistance Switching Characteristics of Nanoscopic Conductive Filament for HfO₂-based MIM stack

K.S. Yew¹、Y. Zhou¹、D.S. Ang¹ (1.Nanyang Tech. Univ. (Singapore))

https://doi.org/10.7567/SSDM.2014.PS-4-4