[PS-6-4] Characterization of GaAs Surface State by Hard X-ray Photoemission Spectroscopy

Y. Saito¹, J. Iihara¹, T. Yonemura¹, K. Yamaguchi¹, D. Tsurumi¹ (1.Sumitomo Electric Industries, Ltd. (Japan))

https://doi.org/10.7567/SSDM.2014.PS-6-4