[PS-6-4] Characterization of GaAs Surface State by Hard X-ray Photoemission Spectroscopy

Y. Saito¹、J. Iihara¹、T. Yonemura¹、K. Yamaguchi¹、D. Tsurumi¹ (1.Sumitomo Electric Industries, Ltd. (Japan))

https://doi.org/10.7567/SSDM.2014.PS-6-4