11:00 〜 11:15

[C-7-2] Investigation of Interface State Density and Fixed Charge of Sr_xSiO_x+2 on the 2×1 Sr-reconstructed Si Substrate

^○S. Taniwaki¹, Y. Hotta^1,3, H. Yoshida^1,3, K. Arafune^1,3, A. Ogura^2,3, S. Satoh^1,3 (1.Univ. of Hyogo, 2.Meiji Univ., 3.JST-CREST(Japan))

https://doi.org/10.7567/SSDM.2015.C-7-2