09:30 〜 09:45

[D-3-3] Wafer–Scale Statistical Characterization of Carbon Nanotube Thin–Film Transistors

^○J. Hirotani¹, S. Kishimoto¹, Y. Ohno¹ (1.Nagoya Univ.(Japan))

https://doi.org/10.7567/SSDM.2015.D-3-3