10:15 〜 10:30

[D-3-6L] Direct Evidence of Defect-defect Correlation in Atomically Thin MoS₂ Layer by Random Telegraphic Signals Observed in Back-gated FETs

^○N. Fang¹, K. Nagashio¹, A. Toriumi¹ (1.Univ. of Tokyo(Japan))

https://doi.org/10.7567/SSDM.2015.D-3-6L