11:45 AM - 12:00 PM

[H-7-5L] Characterization and Topological Properties of Bi2Se3 Thin Film Grown by using Physical Vapor Deposition

Y. C. Lin¹, Y. S. Chen¹, C. C. Lee¹, J. K. Wu¹, H. Y. Lee¹, ^○Y. H. Chang¹ (1.National Taiwan Univ.(Taiwan))

https://doi.org/10.7567/SSDM.2015.H-7-5L