The Japan Society of Applied Physics

9:50 AM - 10:10 AM

[K-3-3] Quantitative Understanding of Scanning Spreading Resistance Microscopy with Schottky Contact Model

S. Itai1, L. Zhang1, K. Matsuzawa1, M. Ono1, T. Ishihara1 (1.Toshiba Corp.(Japan))

https://doi.org/10.7567/SSDM.2015.K-3-3