Using Sub-microsecond Measurement to Monitor AC NBTI and Dividing Trap Types into NIT, NHT and NFT through Adjustable Stress Frequency and Measure Frequency

6:05 PM - 6:25 PM

[K-5-3] Using Sub-microsecond Measurement to Monitor AC NBTI and Dividing Trap Types into N_IT, N_HT and N_FT through Adjustable Stress Frequency and Measure Frequency

^○C. H. Chiang¹, N. Ke¹, S. N. Kuo¹, A. Juan¹, K. C. Su¹ (1.United Microelectronics Corp.(Taiwan))