2015 International Conference on Solid State Devices and Materials
Sep 27, 2015 - Sep 30, 2015 Sapporo Convention Center, Sapporo, Japan
11:25 AM - 11:45 AM
[K-7-3] Estimation of Soft Error Tolerance According to the Thickness of Buried Oxide and Body Bias 28-nm and 65-nm in FD-SOI Processes by a Monte-Carlo Simulation
○K. Zhang1, J. Yamaguchi1, S. Kanda1, J. Furuta1, K. Kobayashi1 (1.Kyoto Inst. of Tech.(Japan))
