11:25 〜 11:45

[K-7-3] Estimation of Soft Error Tolerance According to the Thickness of Buried Oxide and Body Bias 28-nm and 65-nm in FD-SOI Processes by a Monte-Carlo Simulation

^○K. Zhang¹, J. Yamaguchi¹, S. Kanda¹, J. Furuta¹, K. Kobayashi¹ (1.Kyoto Inst. of Tech.(Japan))

https://doi.org/10.7567/SSDM.2015.K-7-3