The Japan Society of Applied Physics

6:10 PM - 6:25 PM

[M-5-3] 1.7 KV Breakdown C-H Diamond MOSFETs with High Drain Current Density

Y. Kitabayashi1, T. Yamada1, D. Xu1, T. Saito1, D. Matsumura1, A. Hiraiwa1, H. Kawarada1 (1.Waseda Univ.(Japan))

https://doi.org/10.7567/SSDM.2015.M-5-3