4:05 PM - 4:35 PM [O-2-1] (Invited) Scaling and Optimization of Ferroelectric Hafnium Oxide for Memory Applications and Beyond ○J. Müller, P. Polakowski, S. Riedel (1.Fraunhofer IPMS-CNT(Germany)) https://doi.org/10.7567/SSDM.2015.O-2-1