16:35 〜 16:55 [O-2-2] Effect of Stress on Ferroelectricity of (Hf0.5Zr0.5)O2 Thin Films ○H. Funakubo1,, T. Shiraishi1, T. Shimizu1, T. Yokouchi1, T. Oikawa1, H. Uchida2 (1.Tokyo Tech, 2.Sophia Univ.(Japan)) https://doi.org/10.7567/SSDM.2015.O-2-2