Reproducing Resistive Switching Effect by Soret and Fick Diffusion in Resistive Random Access Memory (ReRAM)

K. Kinoshita

doi:https://doi.org/10.7567/SSDM.2015.O-3-4

10:10 AM - 10:30 AM

[O-3-4] Reproducing Resistive Switching Effect by Soret and Fick Diffusion in Resistive Random Access Memory (ReRAM)

^○K. Kinoshita^1,2, R. Koishi¹, T. Moriyama^1,2, K. Kawano¹, H. Miyashita^1,2, S. S. Lee^1,2, S. Kishida^1,2 (1.Tottori Univ., 2.Tottori Integrated Frontier Res. Center(Japan))

https://doi.org/10.7567/SSDM.2015.O-3-4

2015 International Conference on Solid State Devices and Materials

[O-3-4] Reproducing Resistive Switching Effect by Soret and Fick Diffusion in Resistive Random Access Memory (ReRAM)