09:30 〜 09:50

[O-6-2] Effects of Cell V_th State and Number of Traps on Statistical Distribution of Random Telegraph Noise in Scaled NAND Flash Memory

T. Tomita¹, ^○K. Miyaji¹ (1.Shinshu Univ.(Japan))

https://doi.org/10.7567/SSDM.2015.O-6-2