9:30 AM - 9:50 AM [O-6-2] Effects of Cell Vth State and Number of Traps on Statistical Distribution of Random Telegraph Noise in Scaled NAND Flash Memory T. Tomita1, ○K. Miyaji1 (1.Shinshu Univ.(Japan)) https://doi.org/10.7567/SSDM.2015.O-6-2