[PS-1-19L] Investigation and Comparison of Quantum-Capacitance Induced Inversion-Charge Loss for Ultra-Thin-Body and Double-Gate III-V n-MOSFETs

^○S. L. Shen¹, H. H. Shen¹, C. H. Yu¹, P. Su¹ (1.National Chiao Tung Univ.(Taiwan))

https://doi.org/10.7567/SSDM.2015.PS-1-19L