[PS-12-18] Influence of Si Surface on Spin Accumulation and Transport Signals in CoFe/MgO/n⁺-Si Junctions

^○M. Ishikawa¹, H. Sugiyama¹, T. Inokuchi¹, K. Hamaya², N. Tezuka³, Y. Saito¹ (1.Toshiba Corp., 2.Osaka Univ., 3.Tohoku Univ.(Japan))

https://doi.org/10.7567/SSDM.2015.PS-12-18